CIM has developed test systems for more than two decades and we work with everything from simple to complex devices, PCBA, final build, off-line and in-line testing. Our main conclusion is this: The more standardized a test system is, the lower the Total Cost of Ownership will be – simply because the Operational Test Costs are reduced during the test system’s lifetime.
From Bench Top to Rack Based systems, from Offline to Inline systems, CIM offers yearlong experience in defining the right test platforms for our customer’s needs.
Platform Elements and things to consider
Dennis Morini, Business Development Manager